Laboratory Micro-X-Ray Fluorescence Spectroscopy
Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.
Gives a description of the main instrumental influences on the analytical performanceDiscusses the different quantification models of X-ray measurements considering the special requirements to the analysis of non-homogeneous materialsSupplies an overview of X-ray fluorescence applications with various suggestions for the use of the analytical potential of this method