Ellipsometry of Functional Organic Surfaces and Films
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Provides a state of the art report of the technique of ellipsometryPresents recent developments in ellipsometric real-time/in-situ monitoring techniquesIs oriented towards the high technological interest in the characterization of functional organic films and surfacesIncludes the collection of optical constantsWritten by leading scientists